350 rub
Journal Nanotechnology : the development , application - XXI Century №4 for 2014 г.
Article in number:
Investigation of influence of particle rupture of low-dimensional nano-wires on UI characteristics
Authors:
S.V. Spiridonov - Post-graduate Student, Institute of Radio-Engineering and Telecommunications, Nanotechnologies in Electronics Department, Kazan National Research Technical University named after A.N. Tupolev. E-mail: com-m-a-i-l@yandex.ru N.N. Rusyaev - Ph.D. (Eng.), Associate Professor, Institute of Radio-Engineering and Telecommunications, Nanotechnologies in Electronics Department, Kazan National Research Technical University named after A.N. Tupolev. E-mail: nnrusjaev@kai.ru A.A. Trifonov - Assistant, Institute of Radio-Engineering and Telecommunications, Nanotechnologies in Electronics Department, Kazan National Research Technical University named after A.N. Tupolev. E-mail: blast_88@mail.ru I.R. Safina - Student, Institute of Radio-Engineering and Telecommunications, Nanotechnologies in Electronics Department, Kazan National Research Technical University named after A.N. Tupolev. E-mail: vinchik1605@yandex.ru
Abstract:
Extended Hueckel method was used for study conductive properties of low-dimensional conductors with a particle rupture defect. The influence of the length and number of one-dimensional chains on current-voltage characteristics of the structure was considered. There was held a comparative analysis of the transport properties of defective wires with various types conductive bridges.
Pages: 42-46
References

 

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