Tein Tun Njunt - Post-graduate Student, Department of Information Systems and Technologies, Southwest State University (Kursk) E-mail: htunnyunt@mail.ru

The problem of online embedded hardware-level unit fault detection in mesh-connected logical multicontrollers is considered. Three known approaches to the multicontroller test are highlighted, distributed independent self-test, mutual inter-unit test, and combined multiplexed test. The successful fault detection probability in mesh-connected logical multicontrollers is evaluated for the test methods selected; the dependencies of the above probability on the multicontroller topology dimension and standalone test unit testability are investigated. The mutual inter-unit test and combined multiplexed test are shown to be preferred in such cases when separate test units guarantee medium to high fault detection probability, with the combined multiplexed test being more efficient in low dimension systems.

 

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