V.V. Ivanov¹, G.S. Voronkov², A.G. Zakoyan³, I.V. Stepanov⁴, A.V. Voronkova⁵, R.V. Kutluyarov⁶, E.P. Grakhovna⁷

1−7 Ufa University of Science and Technology (Ufa, Russia)

Optical sensors and interrogation systems are critical nowadays. The article discusses the frequency interrogation method based on an optoelectronic oscillator for acoustic emission measurement systems and a photonics-integrated interrogator. The optoelectronic oscillator consists of a phase modulator and a feedback circuit, which includes an optical notch filter, a photodiode, and an amplifier. The output frequency of microwave oscillations at the output of the optoelectronic oscillator is determined by the change in the resonant frequency of the filter in the feedback circuit. In the scheme under consideration, the phase-shifted Bragg grating is used as a notch filter. Physical impact (for example, deformation or acoustic impact) causes a change in the Bragg wavelength and, consequently, a change in the frequency of microwave oscillations at the output of the optoelectronic oscillator. The measuring signal of the interrogator makes it possible to determine the parameters of the acoustic impact. To measure the frequency of these oscillations, the interrogation circuit is supplemented with a frequency conversion unit, which makes it possible to reduce the values of the measured frequency, thereby reducing the complexity and cost of the measuring equipment and increasing the degree of integration of the sensing system. To verify the proposed method, a simulation of the frequency interrogation system was carried out for the case of a change in the amplitude of acoustic emission signals from 3∙10-12 m to 3∙10-11 m. Considering the proposed frequency conversion scheme, the performance of the interrogation system was estimated. It amounted to 12.5 MHz. Simulation confirms the possibility of application and effectiveness of the proposed method in non-destructive testing systems. It is shown that the proposed scheme can be used in non-destructive testing applications, including the detection and evaluation of microcrack growth dynamics. The analysis of platforms for manufacturing photonic integrated circuits and elements for implementing the frequency converter shows the feasibility of the presented scheme. The interrogator can be produced on the SOI (silicon on insulator) platform or on InP, however, in this case, the dimensions of the photonic integrated circuit will increase significantly. As an element base for frequency conversion, electronic components manufactured by Analog Devices, Texas Instruments, UMS, Quorvo, Milandr and Miran can be used.

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