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Journal Electromagnetic Waves and Electronic Systems №3 for 2020 г.
Article in number:
Electrical fluctuations and non-destructive testing of electronic devices (review)
DOI: 10.18127/j15604128-202003-07
UDC: 538.9
Keywords: Fluctuations noise electrical solids electron devices
Authors:

B.I. Yakubovich – Ph.D.(Phys.-Math.), Senior Research Scientist,
Petersburg Nuclear Physics Institute named by B.P. Konstantinov of NRC «Kurchatov Institute» E-mail: yakubovich_bi@pnpi.nrcki.ru

Abstract:

The increasing complexity of electronic equipment, the increase in its functional significance, increase the requirements for quality and reliability of electronic devices. In this regard, it is necessary to develop and improve non-destructive testing of electronic devices. For this purpose, electrical fluctuation phenomena can be used. Several types of electrical noise, including those of fundamental origin, are associated with structural defects in solids. Obviously, spectral characteristics of noise can contain information on the degree of defectiveness of solids and, therefore, on the quality of electronic devices based on them. Therefore, it is advisable to study in detail possibility of using electrical fluctuations for non-destructive testing of electronic devices.
Provide an overview of studies of electrical fluctuations in solids and electronic devices. Consider effect of structural defects in solids on formation of electrical fluctuations. Find out relationship of the spectral characteristics of electrical fluctuations with the quality and reliability of electronic devices. Based on this, draw conclusions about the possibilities of using electric fluctuations for non-destructive testing of electronic devices.

Electrical fluctuations in solids and electronic devices are considered. Their relationship with defects in the structure of solids and with the quality and reliability of electronic devices is analyzed. Focus is on excess low-frequency noise, which is most important in this regard. It is shown that for the most significant theoretical models of excess noise in semiconductors and metals, noise spectral density is directly related to the number of defects in materials. Connection of excess noise with degradation processes in electronic devices is established. Large number of experimental results is presented showing relationship of excess noise with structural defects in solids and with quality and reliability of electronic devices. Wide possibilities of using electric fluctuations for non-destructive testing of electronic devices are substantiated.
Possibility of using electrical fluctuations for non-destructive testing of various types of solid-state electronic devices is shown. Nondestructive testing based on analysis of electrical fluctuations is widely applicable and highly effective. Its use can contribute to a significant increase in the quality and reliability of electronic devices.

Pages: 65-98
For citation

Yakubovich B.I. Electrical fluctuations and non-destructive testing of electronic devices (review) // Electromagnetic waves and electronic systems. 2020. V. 25. № 3. P. 65−80. DOI: 10.18127/j15604128-202003-07 (in Russian).

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Date of receipt: 3 марта 2020 г.