I.V. Zhukova – Undergraduate, Department «Computer systems and networks», Kaluga branch of the Bauman MSTU E-mail: zhukova.irina93@gmail.com
A.V. Rodionov – Ph.D.(Eng.), Associate Professor, Department «Computer systems and networks», Kaluga branch of the Bauman MSTU
E-mail: andviro@gmail.com
I.V. Chukhraev – Ph.D.(Eng.), Associate Professor, Head of Department «Computer systems and networks», Kaluga branch of the Bauman MSTU
E-mail: chukhraev@bmstu-kaluga.ru
Problems of the ensuring the efficiency of the development testing of systems on a chip in conditions of replacing the imported element base with the domestic one are considered. The shortcomings of systems with foreign components are revealed, their domestic analogues, which allow to solve the problem of reducing the cost of a microassembly due to the absence of hulls of its elements, are descibed. The features of testing microassemblies on the example of the unit of the speech-forming device, which is part of the communication system, are considered. A technique for virtual testing of a system on a chip is proposed, with the project divided into modules. The results of testing of individual microassembly modules are described.
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