N.S. Kulagina - Student, Kaluga branch, Bauman MSTU E-mail: kulagina.natalia2013@yandex.ru S.A. Adarchin - Ph.D. (Eng.), Associate Professor, Kaluga branch, Bauman MSTU E-mail: adarchin@rambler.ru V.G. Kosushkin - Dr.Sc. (Eng.), Professor, Kaluga branch, Bauman MSTU E-mail: kosushkin@gmail.com

The urgency and importance of concept of scientific investigation on reliability improvement of electronics ensuring minimal failures of electronic systems and developing fail-safe systems is pointed out. The goal of the paper is to define the relationship between reliability of electronic components and reliability of a car. To acieve this goal the following problems are considered: defining the level of automotive electronics reliability in overall reliability of a car; finding the most important manufacturing and operational factors influencing automotive electronics reliability; suggesting methods of reducing influence of negative factors in manufacturing process. The importance of electronics as a part of the car from the economic point of view is defined and the data illustrating the share occupied by electronics in the overall cost of the car are provided. It is pointed out that the most important reasons of degradation of semiconductor characteristics are both technological fault, taking place while making parts of automotive electronics, and crystal defects in the pattern of semiconductor materials. An example of defects appeared in board assembly of DirectFET elements is considered. It is shown that these defects result in damage and failure of electronic components. A detailed explanation of the fact that the defects of the semiconductor arising at various stages of life cycle of devices render one of the defining impacts on reliability of automobile electronics is also described. In the paper, a classification of mechanical tensions in structures of semiconductor devices is proposed. A method of reduction of negative factors which influence on reliability of electronic devices is developed. This research lays the foundation for further research into the development of a systematic process or approach for reliability im-provement of automotive electronics.

 

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