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Journal Electromagnetic Waves and Electronic Systems №10 for 2013 г.
Article in number:
Electrical tightness of flange connection with thin dielectric spacer
Authors:
D.A. Kuznetsova - design engineer, Microwave laboratory, Scientific-research enterprise - Kaluga instrument-building plant "Taifun" (JSC "Taifun")
Abstract:
The mechanical wear and corrosion of waveguide butt joint problem is under consideration. The candidate solution is placed, which adds up to thin dielectric spacer accommodation between flanges. Results of different materials and thicknesses modeling are adduced. Comparative analysis of key parameters (viz. a return loss, transmission loss and two closely spaced connection interactions) is carried out.
Pages: 29-35
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