Investigation of influence of particle rupture of low-dimensional nano-wires on UI characteristics
- 1 Post-graduate Student, Institute of Radio-Engineering and Telecommunications, Nanotechnologies in Electronics Department, Kazan National Research Technical University named after A.N. Tupolev
- 2 Ph.D. (Eng.), Associate Professor, Institute of Radio-Engineering and Telecommunications, Nanotechnologies in Electronics Department, Kazan National Research Technical University named after A.N. Tupolev
- 3 Assistant, Institute of Radio-Engineering and Telecommunications, Nanotechnologies in Electronics Department, Kazan National Research Technical University named after A.N. Tupolev
- 4 Student, Institute of Radio-Engineering and Telecommunications, Nanotechnologies in Electronics Department, Kazan National Research Technical University named after A.N. Tupolev
Abstract
Extended Hueckel method was used for study conductive properties of low-dimensional conductors with a particle rupture defect. The influence of the length and number of one-dimensional chains on current-voltage characteristics of the structure was considered. There was held a comparative analysis of the transport properties of defective wires with various types conductive bridges.
How to cite
Спиридонов С.В., Русяев Н.Н., Трифонов А.А., Сафина И.Р. Исследование влияния частичного разрыва низкоразмерного нанопровода на его вольт-амперные характеристики // Нанотехнологии: разработка, применение - XXI век. 2014. № 4. С. 42–46.
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