Influence of thin dielectric films quality on the integrated circuits reliability
- 1 Process Engineer, JSC "VOSHOD"-KRLZ
- 2 Ph. D. (Eng.), Associate Professor, Kaluga branch of the Bauman MSTU
Keywords:
integrated circuittransistorcapacitordynamic characteristicsslew rateoperational amplifier
Abstract
The main parameters of the bipolar n-p-n-transistor influencing the dynamic performance of the operational amplifiers. Defined impact analysis of parameters such as the depth of the base of the transistor, the magnitude of the thin-film capacitor, the value of the base resistor on DU intake currents, the slew rate the slew rate (response rate), and the settling time of the output voltage.
How to cite
Глотова О.Н., Адарчин С.А. Влияние технологических и конструкторских параметров на динамические характеристики интегральных микросхем на основе биполярных транзисторов // Электромагнитные волны и электронные системы. 2017. № 5. С. 40–46.
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