D.M. Dolgintsev

Д.М. Долгинцев

2 articles 2011–2015

Наноматериалы и наноструктуры - XXI век 2

2015

The use of back skattering electron diffraction for nanophase analysis of thin Pb(Zr,Ti)O<sub>3</sub> films Наноматериалы и наноструктуры - XXI век, No. 4, 2015 pp. 21-28

2011

Prospects of electron probe X-ray microanalysis techniques for composition determination of nanosized lead zirconate-titanate films Наноматериалы и наноструктуры - XXI век, No. 4, 2011 pp. 48-55