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- The Quality Test of Dielectric Layers of Integrated Circuits and Products of Microsystem Engineering pp. 44-52
- Research of the Enciphering Method Based on Use of Lorentz Attractor as the Generator of Determined Chaos pp. 599-604
- The quality test of dielectric layers of integrated circuits and products of microsystem engineering pp. 44-52
- Mathematical modeling and investigation of socio economic system dynamics (on the example of the USA) pp. 189-195