S.G. Vorona1, S.S. Zykova2, D.I. Kazantsev3, G.V. Kremez4

1–4 Mozhaisky Military Space Academy (St. Petersburg, Russia)
 

The article discusses the technology of studying the characteristics of the electronic component base (ECB)) in the process of exposure to external factors of natural and artificial origin, as well as the goals of development and its implementation. The influence of space factors on the resource of on-board electronic devices and the number of failures of the tested chips and their resource is estimated. Experimental studies are currently planned studies on the International Space Station (ISS), which involve further full-scale development of technologies to increase the stability of the functioning of on-board electronic equipment and are aimed at solving the problem of achieving the duration of active operation of domestic spacecraft, it seems promising to conduct tests for resistance to the effects of space factors in the absence of specialized protection of flash memory chips based on both traditional principles and different from them.

The purpose of the work – to show the technology of experimental research of the operability of the element base of computer equipment under the influence of natural and artificial interference, as well as the algorithm for evaluating the operability of memory chips and prospective studies of these circuits, as well as to justify the operating time to failure of the memory components of the onboard computer system based on experimental data and forecasting and, as a consequence, to determine the effective degree of redundancy.

Vorona S.G., Zykova S.S., Kazantsev D.I., Kremez G.V. Predictive Memory chip health based on advanced data. Science Intensive Technologies. 2023. V. 24. № 6. P. 37−42. DOI: https://doi.org/10.18127/ j19998465-202306-04 (in Russian)

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