V.A. Ivanov, D.F. Shukshin, V.N. Tkach

Problem statement. The nonlinear location of objects with semiconductor elements is associated with a number of difficulties - weak signals at multiple harmonics, operation in the near field of the locator in manual mode, significant attenuation of signals with distance, etc. But the main problem is the difficulty in interpreting the results, especially in a complex interference environment. One of the ways to improve the quality of detection and cognition in a nonlinear location is to build a spatial picture of the distribution of signals in the examined space. This will make it possible to confidently select point and extended objects, and target the geometric center of the source of secondary re-emissions at multiple harmonics.

Goal. Approbation of a method for detecting, recognizing, and spatially selecting targets in the secondary processing of nonlinear location signals. Results. Estimated performance indicators of promising automated nonlinear location complexes based on secondary signal processing have been obtained.

Practical significance. The structure of a hardware and software complex for secondary processing of nonlinear location signals has been developed, which makes it possible to obtain patterns of spatial distribution of signals on multiple harmonics in an automated mode.

Ivanov V.A., Shukshin D.F. Tkach V.N. Secondary processing of nonlinear location signals. Radiotekhnika. 2025. V. 89. № 2.
P. 16−23. DOI: https://doi.org/10.18127/j00338486-202502-03 (In Russian)

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