E.M. Il'ina – Ph.D.(Phys.-Math.), Senior Research Scientist, Leading Research Scientist, JSC «SPE «Almaz» (Saratov) E-mail: ilinaem@almaz-rpe.ru

The method of determining measured resistance of absorber by its surface resistance is suggested. Dependence of surface-tomeasuring resistance ratio on both the value of the absorber film width, the value of ohm resistor of the film on direct current, and a distance between centers of contacts between measuring electrodes and the film is obtained. It is shown that with the increase of the absorber film width, a ratio of surface-to-measuring resistance is growing.

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