V.I. Anisimkin – Dr.Sc.(Phys.-Math.), Main Research Scientist, Kotel'nikov IRE of RAS (Moscow) E-mail: anis@cplire.ru
N.V. Voronova – Kotel'nikov IRE of RAS (Moscow); Head of Laboratory, Elpa Corporation (Moscow) E-mail: vonavl@mail.ru
A.S. Kuznetsova – Ph.D.(Phys.-Math.), Research Scientist, Kotel'nikov IRE of RAS (Moscow)
V.A. Osipenko – Ph.D.(Phys.-Math.), Senior Research Scientist, Elpa Corporation (Moscow) E-mail: npk1elpa@mail.ru
This paper presents a new method for monitoring the acousto-electronic device operation characteristics by depositing a piezoelectric film of one material on a piezoelectric plate of another material. Using AlN film and Bi12GeO20 plate as an example, it is shown that the operation frequency of the devices connected with propagation velocity and the insertion loss of the same devices correlated with the coupling constant may be increased or decreased depending on the film thickness, acoustic mode number, and interdigital transducer configuration.
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