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Journal Radioengineering №7 for 2015 г.
Article in number:
Stability margin increase of transistor oscillator steady state regime method
Authors:
A.V. Kononov - Ph. D. (Eng.), Senior Research Scientist, Moscow. E-mail: uncordel@yandex.ru
Abstract:
This paper focuses on the efficient transistor oscillator steady-state regime stability margin increase method proposed by author. This method is based on the use of correction in oscillator self-bias circuit. The oscillator CAD model is based on the system of Evtyanov-s symbolic shortened differential equations. Specific feature of this model is accounting of intrinsic thermal feedback impact, which occurs owing to transistor electrophysical parameters temperature dependence. The oscillator steady-state regime stability analysis is based on the Routh-Hurwitz algebraic criterion. The suppression feature of oscillation self-modulation caused by excessive self-bias circuit inertance impact is experimentally proved by the proposed correction modification.
Pages: 124-130
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