A.F. Ulasen¹, I.V. Mazhara², V.P. Kiselevich³, A.D. Gavrilov⁴, M.V. Shiryaev⁵, M.A. Khokhlov⁶
¹ˑ²Army Air Defense Military Academy (Smolensk, Russia)
³ˑ⁴JSC "Concern Morinsis-Agat" (Moscow, Russia)
⁵ˑ⁶RTU MIREA (Moscow, Russia)
¹ˑ²Ulas.s@mail.ru
The steady complication and increase in the number and type of tasks solved by modern electronic means of complex technical systems, the increase in their structural and functional complexity, the increasing importance and responsibility of the tasks assigned to them, determine their overall structure, the basic requirements imposed on them, and cause the problem of ensuring their reliability. The design and development of complex technical systems is impossible without analyzing and predicting their reliability. At the same time, the objectives of the analysis are the rational distribution of reliability between the components of the equipment, the choice of the structure that provides the highest values of reliability indicators, the determination of the required degree of redundancy, the rational choice of the initial values of the parameters of the components of the equipment, which makes it possible to justify the parameters of the STS operating system, including the service life. The most promising direction of substantiating the service life of electronic devices is the use of the theory of semi-Markov processes, which allows taking into account all the variety of probabilistic processes accompanying the operation of complex technical systems. At the same time, the methodology for determining the service life should be based on the choice of such a semi-Markov model of the operation process, which would allow, on the one hand, to calculate the availability coefficient of the STS distribution zone, and on the other hand, to justify the parameters of the system of operation of complex technical systems, including one of the main ones – their service life.
Ulasen A.F., Mazhara I.V., Kiselevich V.P., Gavrilov A.D., Shiryaev M.V., Khokhlov M.A. Justification of the service life of complex technical systems. Information-measuring and Control Systems. 2026. V. 24. № 1. P. 56−61. DOI: https://doi.org/10.18127/j20700814-202601-06 (in Russian)
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