Yu.A. Kolosov, F.E. Levkov
A possibility to carry out the waveguide measurements of dielectric material electric parameters for different incident angles at some wavelength based on using the waveguide circuit, in which the measurements are fulfilled in the waveguide with standard cross section and dielectric sample is placed in the waveguide with modified cross section in which the wide wall has different size, is considered. Analysis of the proposal waveguide circuit is carried out.