© Y.V. Kuznetsov, A.B. Baev, M.A. Bekhtin, A.A. Sergeev
Advanced techniques for the electronic devices spurious emissions detection in ultra wide frequency band are presented. The analytical description of the generating, measuring, and processing of the electronic devices spurious emissions are obtained. The model of the electromagnetic radiation for the electronic devices in the test mode has been synthesized. The algorithm for the conversion of the measured signal in the linear parametric device is described in the paper. The CRT monitor spurious emissions measurement experimental results were used as a demonstration of the effectiveness of the information harmonics detection in the test mode.