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Laser mass spectrometer with dual-pulse dual-frequency desorption of ions of organic compounds from nanostructured silicon surface

DOI 10.18127/j15604128-201902-06

Keywords:

A.V. Pento – Ph.D.(Phys.-Math.), Senior Research Scientist, GPI RAS (Moscow)
E-mail: pentan@mail.ru
I.I. Kuzmin – Junior Research Scientist, Vernadsky Institute of Geochemistry and Analytical Chemistry (Moscow)
E-mail: kuzmin.ilya.92@gmail.com
A.R. Mukhamatnurova – Post-graduate Student, National Research Nuclear University «MEPhI» (Moscow)
E-mail: alisson94@mail.ru


A laser mass spectrometer reflectron for two-pulse two-frequency mode implementation in SALDI (Surface Assisted Laser Desorption and Ionization) is described in details. Experimental results for desorption of ions of organic compounds by 351 nm and 263 nm pulsed laser radiation are presented.
A laser mass spectrometer reflectron for two-pulse two-frequency mode implementation in SALDI (Surface Assisted Laser Desorption and Ionization) is described in details. 523 nm, 351 nm and 263 nm pulsed laser radiation can be used for desorption of ions. A SALDI-active layer is being produced on a surface of crystalline silicon inside the vacuum chamber of the mass-spectrometer under pulsed laser irradiation. Gas-phase analyte deposition on the emitter active surface can be performed inside the chamber of the mass spectrometer. Experimental results for desorption of ions of organic compounds by 351 nm and 263 nm pulsed laser radiation are presented.

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