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An approach to implementing distributed hardware-level test in mesh-connected logical multicontrollers

Keywords:

I.V. Zotov - Dr.Sc. (Eng.), Professor, Department “Information systems and technologies” Southwest State University (Kursk). E-mail: zotovigor@yandex.ru Tein Tun Njunt - Post-graduate Student, Department “Information systems and technologies” Southwest State University (Kursk). E-mail: htunnyunt@mail.ru Moe Min Vin - Post-graduate Student, Department “Information systems and technologies” Southwest State University (Kursk). E-mail: htunnyunt@mail.ru


The problem of online embedded hardware-level unit fault detection in mesh-connected logical multicontrollers is considered. A novel approach to the multicontroller test based on the combination of self-test and mutual inter-unit test performed in parallel multiplex mode by a set of each unit neighbors is presented, which allows increasing the fault detection probability. Formal rules are defined for forming sets of testing and tested neighbors for each unit which are invariant to the location of the unit within the topological structure of the multicontroller and its dimension. A parallel hardware-implemented generic distributed test algorithm is developed based on the approach proposed. The unit fault detection probability is evaluated in the case when the proposed approach is used; the fault detection probability vs. multicontroller dimension and the fault detection probability vs. individual built-in test unit reliability dependencies are investigated. The proposed approach is shown to provide increased fault detection probability compared to the mutual inter-unit test and self-test for all practically significant cases.
References:

 

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