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Influence of interphase boundaries and nanoinclusions of lead oxide on the structure and ferroelectric properties of PZT thin films

Keywords:

I.P. Pronin – Ph.D. (Phys.-Math.), Senior Researcher, Ioffe Physical-Technical Institute of the Russian Academy of Sciences
E.Yu. Kaptelov – Ph.D. (Phys.-Math.), Senior Researcher, Ioffe Physical-Technical Institute of the Russian Academy of Sciences
S.V. Senkevich – Ph.D. (Phys.-Math.), Researcher, Ioffe Physical-Technical Institute of the Russian Academy of Sciences
V.P. Pronin – Ph.D. (Phys.-Math.), Associate Professor, Herzen State Pedagogical University of Russia
O.N. Sergeeva – Ph.D. (Phys.-Math.), Chief Engineer, Tver State University, Tver
A.A. Bogomolov – Dr.Sc. (Phys.-Math.), Professor, Tver State University, Tver


The thin-film Pb(Zr,Ti)O3 composites fabricated by RF magnetron sputtering onto cold Pt/SiO2/Si substrate and then annealed at high temperatures (Tann) are studied. The microstructure and physical properties of fabricated PZT-PbO composite are shown to strongly depend on as annealing temperature as film thickness. It is found that the changes of lead oxide content in PZT-PbO composite are extremely unusual with Tann increasing and depend on rates of movement of pyroclore-perovskite boundaries and lead oxide migration to the free surface. The model of perovskite phase crystallization in proposed. According to it, perovskite nucleation and growth begins on the free surface and then is replaced by perovskite crystallization in the value of the composite. As a result, significant amount of lead oxide is localized near bottom interface. It is shown abnormal behavior of dielectric and pyroelectric characteristics to be connected with a number of nanoinclusions and geometry of lead oxide situated as near interfaces, as in intergranular space of the composite.
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